Characterization of low dielectric constant polyaniline thin film synthesized by ac plasma polymerization technique

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Characterization of low dielectric constant polyaniline thin film synthesized by ac plasma polymerization technique

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dc.contributor.author Anantharaman, M R
dc.contributor.author Joseph, Mathai C
dc.contributor.author Saravanan, S
dc.contributor.author Jayalekshmi,S
dc.contributor.author Venkitachalam, S
dc.date.accessioned 2014-07-31T05:35:09Z
dc.date.available 2014-07-31T05:35:09Z
dc.date.issued 2002-01-22
dc.identifier.uri http://dyuthi.cusat.ac.in/purl/4351
dc.description J. Phys. D: Appl. Phys. 35 (2002) 240–245 en_US
dc.description.abstract Polyaniline thin films were prepared by ac plasma polymerization technique. Capacitance, dielectric loss, dielectric constant and ac conductivity of these films were investigated in the frequency range from 100 Hz to 1MHz and in the temperature range from 300 to 373 K. Capacitance and dielectric loss decreased with frequency and increased with temperature. This type of behaviour was found to be in good agreement with an existing model. The ac conductivity σ(ω) was found to vary as ωs with the index s 1. Annealing of polyaniline thin films in high vacuum at 373K for 1 h was found to reduce the dielectric loss. FTIR studies reveal that the aromatic ring is retained in the polyaniline thin films, which enhances the thermal stability of the polymer films en_US
dc.description.sponsorship Cochin University of Science and Technology en_US
dc.language.iso en en_US
dc.publisher IOP Publishing Ltd en_US
dc.title Characterization of low dielectric constant polyaniline thin film synthesized by ac plasma polymerization technique en_US
dc.type Article en_US


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