Damage threshold determination of bulk polymer samples using pulsed photothermal deflection technique

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Damage threshold determination of bulk polymer samples using pulsed photothermal deflection technique

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Title: Damage threshold determination of bulk polymer samples using pulsed photothermal deflection technique
Author: Rajasree, K; Ravikumar, A V; Radhakrishnan, P; Nampoori, V P N; Vallabhan, C P G
Abstract: Photothermal deflection technique was used for determining the laser damage threshold of polymer samples of teflon (PTFE) and nylon. The experiment was conducted using a Q-switched Nd-YAG laser operating at its fundamental wavelength (1-06μm, pulse width 10 nS FWHM) as irradiation source and a He-Ne laser as the probe beam, along with a position sensitive detector. The damage threshold values determined by photothermal deflection method were in good agreement with those determined by other methods.
URI: http://dyuthi.cusat.ac.in/purl/2629
Date: 1992-04


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