Damage threshold determination of bulk polymer samples using pulsed photothermal deflection technique

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Damage threshold determination of bulk polymer samples using pulsed photothermal deflection technique

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dc.contributor.author Rajasree, K
dc.contributor.author Ravikumar, A V
dc.contributor.author Radhakrishnan, P
dc.contributor.author Nampoori, V P N
dc.contributor.author Vallabhan, C P G
dc.date.accessioned 2011-12-09T10:25:40Z
dc.date.available 2011-12-09T10:25:40Z
dc.date.issued 1992-04
dc.identifier.issn 0250-4707
dc.identifier.other Bull. Mater. Sci., Vol.15, No. 2, April 1992, pp. 183-188.
dc.identifier.uri http://dyuthi.cusat.ac.in/purl/2629
dc.description.abstract Photothermal deflection technique was used for determining the laser damage threshold of polymer samples of teflon (PTFE) and nylon. The experiment was conducted using a Q-switched Nd-YAG laser operating at its fundamental wavelength (1-06μm, pulse width 10 nS FWHM) as irradiation source and a He-Ne laser as the probe beam, along with a position sensitive detector. The damage threshold values determined by photothermal deflection method were in good agreement with those determined by other methods. en_US
dc.description.sponsorship Cochin University of Science and Technology en_US
dc.language.iso en en_US
dc.publisher Springer en_US
dc.subject Photothermal deflection technique en_US
dc.subject damage threshold en_US
dc.subject polymer en_US
dc.subject Nd-YAG laser en_US
dc.subject He-Ne laser en_US
dc.title Damage threshold determination of bulk polymer samples using pulsed photothermal deflection technique en_US
dc.type Working Paper en_US
dc.contributor.faculty Technology en_US
dc.identifier.url http://dx.doi.org/10.1007/BF02927444 en_US


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