| dc.contributor.author |
Vijayakumar, K P |
|
| dc.contributor.author |
Dr.Purushothaman, C |
|
| dc.date.accessioned |
2014-04-24T08:51:12Z |
|
| dc.date.available |
2014-04-24T08:51:12Z |
|
| dc.date.issued |
1984-05-28 |
|
| dc.identifier.uri |
http://dyuthi.cusat.ac.in/purl/3649 |
|
| dc.description |
Department of Physics, Cochin University of Science and Technology |
en_US |
| dc.description.abstract |
The thesis aims to present the results of experimental investigations on the changes of optical properties of metallic thin films due to heating. The parameters which are measured are reflectivity, refractive indices and the ellipsometric quantities V and A . The materials used in the studies are metals like Silver, Aluminium and Copper. By applying the optical method the interdiffusion taking place in multilayer
‘films of Aluminium and Silver has also been studied. Special interest has been taken to reveal the mechanisms of the hillock growth and surface roughness caused by heating and their relation with the stress in the film |
en_US |
| dc.description.sponsorship |
Cochin University of Science and Technology |
en_US |
| dc.language.iso |
en |
en_US |
| dc.publisher |
Cochin University of Science and Technology |
en_US |
| dc.subject |
Effects of annealing on silver films |
en_US |
| dc.subject |
Surface changes on copper films due to thermal treatment |
en_US |
| dc.subject |
Optical study of interdiffusion in Al/Ag bilayer films |
en_US |
| dc.subject |
Ellipsometry |
en_US |
| dc.subject |
Ellipsometric study of thermal effects on silver thin film surfaces |
en_US |
| dc.subject |
Light scattering measurements on silver film surface |
en_US |
| dc.title |
Surface studies of some metallic thin films by optical methods |
en_US |
| dc.type |
Thesis |
en_US |