Ramkumar, S; Dr.Vijayakumar, K P(Cochin University of Science & Technology, January , 2006)
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Abstract:
In this work we present the results of our attempt to build a compact
photothermal spectrometer capable of both manual and automated mode of
operation.The
salient features of the system include the ability to analyse thin film, powder
and polymer samples. The tool has been in use to investigate thermal, optical
and transport properties. Binary and ternary semiconducting thin films were
analysed for their thermal diffusivities. The system could perform thickness
measurements nondestructively. Ion implanted semiconductors are widely
studied for the effect of radiation induced defects. We could perform
nondestructive imaging of defects using our spectrometer.The results reported in his thesis on the above in
addition to studies on In2S3 and transparent conducting oxide ZnO have been
achieved with this spectrometer. Various polymer samples have been easily
analysed for their thermal diffusivities. The technique provided ease of
analysis not achieved with conventional techniques like TGA and DSC.
Industrial application of the tool has also been proved by analyzing defects of
welded joints and adhesion of paints. Indigenization of the expensive lock-in-amplifier
and automation has been the significant achievement in the course of
this dissertation. We are on our way to prove the noise rejection capabilities of
our PC LIA.
Description:
Department of Physics,
Cochin University of Science and Technology