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| Abstract: | In the present work we report the preparation details studies on ZnO thin films. ZnO thin films are prepared using cost effective deposition technique viz., Chemical Spray Pyrolysis (CSP). The method is very effective for large area preparation of the ZnO thin film. A new post-deposition process could also be developed to avoid the adsorption of oxygen that usually occurs after the spraying process i.e., while cooling. Studies were done by changing the various deposition parameters for optimizing the properties of ZnO thin film. Moreover, different methods of doping using various elements are also tried to enhance the conductivity and transparency of the film to make these suitable for various optoelectronic applications. |
| Description: | Department of Physics, Cochin University of Science and Technology |
| URI: | http://dyuthi.cusat.ac.in/purl/2950 |
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| Dyuthi-T0941.pdf | (10.41Mb) |
| Abstract: | Effect of varying spray rate on the structure and optoelectronic properties of spray pyrolysed ZnO film is analysed. ZnO films were characterised using different techniques such as X-ray diffraction (XRD), photoluminescence, electrical resistivity measurement, and optical absorption. The XRD analysis proved that, with the increase in spray rate, orientation of the grains changed from (1 0 1) plane to (0 0 2) plane. The films exhibited luminescence in two regions—one was the ‘near band-edge’ (NBE) (∼380 nm) emission and the other one was the ‘blue-green emission’ (∼503 nm). Intensity of the blue-green emission decreased after orientation of grains shifted to (0 0 2) plane. Scanning electron microscope (SEM) analysis of the films asserts that spray rate has major role in improving the crystallographic properties of the films. Moreover resistivity of the films could be lowered to 2.4×10−2 cm without any doping or post-deposition annealing |
| Description: | Applied Surface Science 256 (2010) 6025–6028 |
| URI: | http://dyuthi.cusat.ac.in/purl/4714 |
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| On tuning the o ... rolysed ZnO thin films.pdf | (464.4Kb) |
| Abstract: | This work projects photoluminescence (PL) as an alternative technique to estimate the order of resistivity of zinc oxide (ZnO) thin films. ZnO thin films, deposited using chemical spray pyrolysis (CSP) by varying the deposition parameters like solvent, spray rate, pH of precursor, and so forth, have been used for this study. Variation in the deposition conditions has tremendous impact on the luminescence properties as well as resistivity. Two emissions could be recorded for all samples—the near band edge emission (NBE) at 380 nm and the deep level emission (DLE) at ∼500 nm which are competing in nature. It is observed that the ratio of intensities of DLE to NBE (𝐼DLE/𝐼NBE) can be reduced by controlling oxygen incorporation in the sample. 𝐼-𝑉 measurements indicate that restricting oxygen incorporation reduces resistivity considerably. Variation of 𝐼DLE/𝐼NBE and resistivity for samples prepared under different deposition conditions is similar in nature. 𝐼DLE/𝐼NBE was always less than resistivity by an order for all samples.Thus from PL measurements alone, the order of resistivity of the samples can be estimated. |
| Description: | International Journal of Photoenergy Volume 2013, Article ID 105796, 9 pages |
| URI: | http://dyuthi.cusat.ac.in/purl/4723 |
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| Reliable and Da ... luminescence Technique.pdf | (1.904Mb) |
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