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Dr. C Sudha Kartha >
Please use this identifier to cite or link to this item:
http://purl.org/purl/4712
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| Title: | Non-destructive evaluation of carrier transport properties in CuInS2 and CuInSe2 thin films using photothermal deflection technique |
| Authors: | Sudha Kartha, C
Vijayakumar, K P
Tina, Sebastian
Deepa, K G
Anita, Warrier R |
| Keywords: | Photothermal
Thinfilm
Mobility
Carrier lifetime
Surface recombination velocity |
| Issue Date: | 19-Sep-2009 |
| Publisher: | Elsevier |
| Abstract: | Photothermal deflection technique (PTD) is a non-destructive tool for measuring the temperature distribution
in and around a sample, due to various non-radiative decay processes occurring within the material. This tool
was used to measure the carrier transport properties of CuInS2 and CuInSe2 thin films. Films with thickness
<1 μm were prepared with different Cu/In ratios to vary the electrical properties. The surface recombination
velocity was least for Cu-rich films (5×105 cm/s for CuInS2, 1×103 cm/s for CuInSe2), while stoichiometric
films exhibited high mobility (0.6 cm2/V s for CuInS2, 32 cm2/V s for CuInSe2) and high minority carrier lifetime
(0.35 μs for CuInS2, 12 μs for CuInSe2 |
| Description: | Thin Solid Films 518 (2010) 1767–1773 |
| URI: | http://dyuthi.cusat.ac.in/purl/4712 |
| Appears in Collections: | Dr. C Sudha Kartha
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