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Dr.Sunoj, S M >
Please use this identifier to cite or link to this item:
http://purl.org/purl/4276
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| Title: | Identification of models using failure rate and mean residual life of doubly truncated random variables |
| Authors: | Sunoj, S M
Sankaran, P G |
| Keywords: | Failure rate
Mean Residual Life
Length biased models |
| Issue Date: | 6-Aug-2002 |
| Publisher: | Springer |
| Abstract: | In this paper, we study the relationship between the failure rate and the
mean residual life of doubly truncated random variables. Accordingly, we
develop characterizations for exponential, Pareto 11 and beta distributions.
Further, we generalize the identities for fire Pearson and the exponential
family of distributions given respectively in Nair and Sankaran (1991) and
Consul (1995). Applications of these measures in file context of lengthbiased
models are also explored |
| Description: | Statistical Papers 45, 97-109 (2004) |
| URI: | http://dyuthi.cusat.ac.in/purl/4276 |
| Appears in Collections: | Dr.Sunoj, S M
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