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Please use this identifier to cite or link to this item: http://purl.org/purl/3611

Title: Growth And Characterization Of Te-Se System And Some Tei.I.Urioes
Authors: Kunjomana, A G
Dr.Elizabeth, Mathai
Keywords: Crystal growth
Morphology of crystals
Defects in crystals
Mechanical testing
x-ray diffraction.Te1_xSex
Issue Date: 10-Aug-1992
Publisher: Cochin University Of Science And Technology
Abstract: The physical properties of solid matter are basically influenced by the existence of lattice defects; as a result the study of crystal defects has assumed a central position in solid state physics and materials science. The study of dislocations ixa single crystals can yield a great deal of information on the mechanical properties of materials. In order to secure a full understanding of the processes taking place in semiconducting materials, it is important to investigate the microhardness of these materials-—the most reliable method of determining the fine structure of crystals, the revelation of micro—inhomogenities in the distribution of impurities, the effect of dislocation density on the mechanical properties of crystals etc. Basically electrical conductivity in single crystals is a defect controlled phenomenon and hence detailed investigation of the electrical properties of these materials is one of the best available methods for the study of defects in them. In the present thesis a series of detailed studies carried out in Te—Se system, Bi2Te3 and In2Te3 crystals using surface topographical, dislocation and microindentation analysis as well as electrical measurements are presented
Description: Department of Physics, Cochin University of Science and Technology
URI: http://dyuthi.cusat.ac.in/purl/3611
Appears in Collections:Faculty of Sciences

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