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Please use this identifier to cite or link to this item: http://purl.org/purl/2652

Title: Dielectric and optical properties of europium oxide films
Authors: Jayaraj, M K
Vallabhan, C P G
Keywords: Dielectric Properties
Optical Properties
X-ray Analysis
Europium Oxide
Issue Date: Oct-1989
Publisher: Elsevier
Abstract: The dielectric properties of vacuum-deposited europium oxide films have been investigated in the frequency range from 1 kHz to 1 MHz at various temperatures (300-543 K). The dielectric constant is found to depend on film thickness and it attains a constant value beyond 1000 Å. Films deposited at higher substrate temperatures (above 423 K) exhibit improved dielectric properties owing to the recovery of stoichiometry. The frequency variation of the loss factor exhibits a minimum which increases with rise in temperature. The breakdown field strength (about 106V cm-1) is found to be thickness dependent and it varies in accordance with the Forlani-Minnaja relation. The films exhibit ohmic conduction with an activation energy of 0.86 eV at low electric fields but at higher fields the conductivity becomes space charge limited. X-ray studies show that the films are amorphous in nature. The a.c. conductivity is proportional to ω at low frequency, whereas a square law dependence is observed at higher frequencies. The optical constants n, α and k and optical band gap are calculated from the UV-visible-near-IR spectra.
URI: http://dyuthi.cusat.ac.in/purl/2652
ISSN: 0040-6090
Appears in Collections:Dr.C P Girijavallabhan

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