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Please use this identifier to cite or link to this item: http://dyuthi.cusat.ac.in/purl/2629

Title: Damage threshold determination of bulk polymer samples using pulsed photothermal deflection technique
Authors: Rajasree, K
Ravi Kumar, A V
Radhakrishnan, P
Nampoori, V P N
Vallabhan, C P G
Technology
Keywords: Photothermal deflection technique
damage threshold
polymer
Nd-YAG laser
He-Ne laser
Issue Date: Apr-1992
Publisher: Springer
Abstract: Photothermal deflection technique was used for determining the laser damage threshold of polymer samples of teflon (PTFE) and nylon. The experiment was conducted using a Q-switched Nd-YAG laser operating at its fundamental wavelength (1-06μm, pulse width 10 nS FWHM) as irradiation source and a He-Ne laser as the probe beam, along with a position sensitive detector. The damage threshold values determined by photothermal deflection method were in good agreement with those determined by other methods.
URI: http://dyuthi.cusat.ac.in/purl/2629
ISSN: 0250-4707
Appears in Collections:Dr. V P N Nampoori

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