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Please use this identifier to cite or link to this item: http://purl.org/purl/2585

Title: Effect of self assembly on the nonlinear optical characteristics of ZnO thin films
Authors: Litty, Irimpan
Deepthy, A
Bindu, Krishnan
Kukreja, L M
Nampoori, V P N
Radhakrishnan, P
Technology
Keywords: semiconductor materials
semiconductors
Self-assembly
Sol-gel processing
precipitation
Laser deposition
Optical susceptibility
hyperpolarizability
Other nonlinear optical materials
Optical constants
Issue Date: 2008
Publisher: Elsevier
Abstract: In the present work, we report the third order nonlinear optical properties of ZnO thin films deposited using self assembly, sol gel process as well as pulsed laser ablation by z scan technique. ZnO thin films clearly exhibit a negative nonlinear index of refraction at 532 nm and the observed nonlinear refraction is attributed to two photon absorption followed by free carrier absorption. Although the absolute nonlinear values for these films are comparable, there is a change in the sign of the absorptive nonlinearity of the films. The films developed by dip coating and pulsed laser ablation exhibit reverse saturable absorption whereas the self assembled film exhibits saturable absorption. These different nonlinear characteristics in the self assembled films can be mainly attributed to the saturation of linear absorption of the ZnO defect states.
URI: http://dyuthi.cusat.ac.in/purl/2585
ISSN: 0030-4018
Appears in Collections:Dr. V P N Nampoori

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