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PreviewIssue DateTitleAuthor(s)
Dec-2004Non-Destructive Evaluation of Ion-Implanted Semiconductor Thin Films Using Photothermal Deflections SpectroscopyPaulraj,M; Dr.Vijayakumar, K P
18-Feb-2008Optical and Carrier Transport Properties of Cosputtered Zn–In–Sn–O Films and Their Applications to TFTsJayaraj, M K
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