| dc.contributor.author |
Sunoj, S M |
|
| dc.contributor.author |
Sankaran, P G |
|
| dc.contributor.author |
Maya, S S |
|
| dc.date.accessioned |
2014-07-25T06:09:02Z |
|
| dc.date.available |
2014-07-25T06:09:02Z |
|
| dc.date.issued |
2006-12-20 |
|
| dc.identifier.issn |
0233-1888 print/1029-4910 online |
|
| dc.identifier.uri |
http://dyuthi.cusat.ac.in/purl/4283 |
|
| dc.description |
Statistics, Vol. 41, No. 5, October 2007, 443–451 |
en_US |
| dc.description.abstract |
In this paper, we examine the relationships between log odds rate and various reliability measures
such as hazard rate and reversed hazard rate in the context of repairable systems. We also prove
characterization theorems for some families of distributions viz. Burr, Pearson and log exponential
models. We discuss the properties and applications of log odds rate in weighted models. Further we
extend the concept to the bivariate set up and study its properties. |
en_US |
| dc.description.sponsorship |
Cochin University of Science and Technology |
en_US |
| dc.language.iso |
en |
en_US |
| dc.publisher |
Taylor & Francis |
en_US |
| dc.subject |
Log odds rate |
en_US |
| dc.subject |
Hazard rate |
en_US |
| dc.subject |
Reversed hazard rate |
en_US |
| dc.subject |
Weighted models |
en_US |
| dc.title |
Characterizations of distributions using log odds rate |
en_US |
| dc.type |
Article |
en_US |