| dc.contributor.author |
Sunoj, S M |
|
| dc.contributor.author |
Sankaran, P G |
|
| dc.date.accessioned |
2014-07-25T05:44:51Z |
|
| dc.date.available |
2014-07-25T05:44:51Z |
|
| dc.date.issued |
2002-08-06 |
|
| dc.identifier.uri |
http://dyuthi.cusat.ac.in/purl/4276 |
|
| dc.description |
Statistical Papers 45, 97-109 (2004) |
en_US |
| dc.description.abstract |
In this paper, we study the relationship between the failure rate and the
mean residual life of doubly truncated random variables. Accordingly, we
develop characterizations for exponential, Pareto 11 and beta distributions.
Further, we generalize the identities for fire Pearson and the exponential
family of distributions given respectively in Nair and Sankaran (1991) and
Consul (1995). Applications of these measures in file context of lengthbiased
models are also explored |
en_US |
| dc.description.sponsorship |
Cochin University of Science and Technology |
en_US |
| dc.language.iso |
en |
en_US |
| dc.publisher |
Springer |
en_US |
| dc.subject |
Failure rate |
en_US |
| dc.subject |
Mean Residual Life |
en_US |
| dc.subject |
Length biased models |
en_US |
| dc.title |
Identification of models using failure rate and mean residual life of doubly truncated random variables |
en_US |
| dc.type |
Article |
en_US |