| dc.contributor.author |
Rajasree, K |
|
| dc.contributor.author |
Ravi Kumar, A V |
|
| dc.contributor.author |
Radhakrishnan, P |
|
| dc.contributor.author |
Nampoori, V P N |
|
| dc.contributor.author |
Vallabhan, C P G |
|
| dc.date.accessioned |
2011-12-09T10:25:40Z |
|
| dc.date.available |
2011-12-09T10:25:40Z |
|
| dc.date.issued |
1992-04 |
|
| dc.identifier.issn |
0250-4707 |
|
| dc.identifier.other |
Bull. Mater. Sci., Vol.15, No. 2, April 1992, pp. 183-188. |
|
| dc.identifier.uri |
http://dyuthi.cusat.ac.in/purl/2629 |
|
| dc.description.abstract |
Photothermal deflection technique was used for determining the laser damage threshold of polymer samples of teflon (PTFE) and nylon. The experiment was conducted using a Q-switched Nd-YAG laser operating at its fundamental wavelength (1-06μm, pulse width 10 nS FWHM) as irradiation source and a He-Ne laser as the probe beam, along with a position sensitive detector. The damage threshold values determined by photothermal deflection method were in good agreement with those determined by other methods. |
en_US |
| dc.description.sponsorship |
Cochin University of Science and Technology |
en_US |
| dc.language.iso |
en |
en_US |
| dc.publisher |
Springer |
en_US |
| dc.subject |
Photothermal deflection technique |
en_US |
| dc.subject |
damage threshold |
en_US |
| dc.subject |
polymer |
en_US |
| dc.subject |
Nd-YAG laser |
en_US |
| dc.subject |
He-Ne laser |
en_US |
| dc.title |
Damage threshold determination of bulk polymer samples using pulsed photothermal deflection technique |
en_US |
| dc.type |
Working Paper |
en_US |
| dc.contributor.faculty |
Technology |
en_US |
| dc.identifier.url |
http://dx.doi.org/10.1007/BF02927444 |
en_US |