Title:
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Damage threshold determination of bulk polymer samples using pulsed photothermal deflection technique |
Author:
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Rajasree, K; Ravi Kumar, A V; Radhakrishnan, P; Nampoori, V P N; Vallabhan, C P G
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Abstract:
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Photothermal deflection technique was used for determining the laser damage threshold of polymer samples of teflon (PTFE) and nylon. The experiment was conducted using a Q-switched Nd-YAG laser operating at its fundamental wavelength (1-06μm, pulse width 10 nS FWHM) as irradiation source and a He-Ne laser as the probe beam, along with a position sensitive detector. The damage threshold values determined by photothermal deflection method were in good agreement with those determined by other methods. |
URI:
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http://dyuthi.cusat.ac.in/purl/2629
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Date:
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1992-04 |