dc.contributor.author |
Jayakrishnan, R |
|
dc.contributor.author |
Dr.Vijayakumar, K P |
|
dc.date.accessioned |
2011-11-13T07:32:12Z |
|
dc.date.available |
2011-11-13T07:32:12Z |
|
dc.date.issued |
2008-04 |
|
dc.identifier.uri |
http://dyuthi.cusat.ac.in/purl/2521 |
|
dc.description |
Department of Physics,
Cochin University of Science and Technology |
en_US |
dc.description.abstract |
The present thesis can be divided into three areas:1) the
fabrication of a low temperature photo-luminescence and photoconductivity
measuring unit 2) photo-luminescence in the chalcopyrite
CulnSez and CulnS2 system for defect and composition analysis and
3) photo-luminescence and photo-conductivity of In:JS3. This thesis
shows that photo-luminescence is one of most essential semiconductor
characterization tool for a scientific group working on photovoltaics.
Tools which can be robust, non-destructive, requiring minimal sample
preparation for analysis and most informative of the device
applications are sought after by industries and this thesis is towards
establishing photo-luminescence as "THE" tool for semiconductor
characterization. The possible application of photo-luminescence as a
tool for compositional and quality analysis of semiconductor thin
films has been worked upon by this thesis. Photo-conductivity
complement photo-luminescence and together they provide all the
information required for the fabrication of an opto-electronic device. |
en_US |
dc.language.iso |
en |
en_US |
dc.publisher |
Cochin University of Science & Technology |
en_US |
dc.subject |
semiconductor thin films |
en_US |
dc.subject |
photovoltaic |
en_US |
dc.subject |
photo-conductivity |
en_US |
dc.subject |
CulnS2 Thin Films |
en_US |
dc.subject |
Photoluminescence |
en_US |
dc.subject |
Opto-electronic Characterization |
en_US |
dc.title |
Defect analysis of semiconductor thin films for photovoltaic applications using photo-luminescence and photo-conductivity |
en_US |
dc.type |
Thesis |
en_US |
dc.contributor.faculty |
Science |
en_US |