Biju Kumar, S; Raveendranath, U; Mohanan, P; Mathew, K T; Hajian,M; Ligthart, L P(Microwave and Optical Technology Letters, July 20, 2000)
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Abstract:
A simple and efficient method for determining the complex
permittivity of dielectric materials from both reflected and transmitted signals is presented. It is also novel because the technique is implemented using two pyramidal horns without any focusing mechanisms. The dielectric constant of a noninteractive and distributive (NID) mixture of dielectrics is also determined