Measurement of laser ablation threshold on doped BiSrCaCuO high temperature superconductors by the pulsed photothermal deflection technique

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Measurement of laser ablation threshold on doped BiSrCaCuO high temperature superconductors by the pulsed photothermal deflection technique

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dc.contributor.author Rajasree, K
dc.contributor.author Vidyalal, V
dc.contributor.author Radhakrishnan, P
dc.contributor.author Nampoori, V P N
dc.contributor.author Vallabhan, C P G
dc.date.accessioned 2011-12-02T05:15:55Z
dc.date.available 2011-12-02T05:15:55Z
dc.date.issued 1993-08-01
dc.identifier.other J. Appl. Phys. 74 (3), 1 August 1993
dc.identifier.uri http://dyuthi.cusat.ac.in/purl/2577
dc.description.abstract Laser‐induced damage and ablation thresholds of bulk superconducting samples of Bi2(SrCa)xCu3Oy(x=2, 2.2, 2.6, 2.8, 3) and Bi1.6 (Pb)xSr2Ca2Cu3 Oy (x=0, 0.1, 0.2, 0.3, 0.4) for irradiation with a 1.06 μm beam from a Nd‐YAG laser have been determined as a function of x by the pulsed photothermal deflection technique. The threshold values of power density for ablation as well as damage are found to increase with increasing values of x in both systems while in the Pb‐doped system the threshold values decrease above a specific value of x, coinciding with the point at which the Tc also begins to fall.   en_US
dc.description.sponsorship Cochin University of Science and Technology en_US
dc.language.iso en en_US
dc.publisher American Institute of Physics en_US
dc.subject ablation en_US
dc.subject laser radiation en_US
dc.subject power density en_US
dc.subject Bismuth oxides en_US
dc.subject Calcium oxides en_US
dc.subject Strontium oxides en_US
dc.subject copper oxides en_US
dc.subject lead oxides en_US
dc.subject Multi-element compounds en_US
dc.subject Superconducting films en_US
dc.subject transition temperature en_US
dc.title Measurement of laser ablation threshold on doped BiSrCaCuO high temperature superconductors by the pulsed photothermal deflection technique en_US
dc.type Working Paper en_US
dc.contributor.faculty Technology en_US


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