Thermal characterization of intrinsic and extrinsic InP using photoacoustic technique

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Thermal characterization of intrinsic and extrinsic InP using photoacoustic technique

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dc.contributor.author V P N Nampoori
dc.contributor.author Radhakrishnan, P
dc.contributor.author Girijavallabhan, C P
dc.contributor.author Sajan, D George
dc.date.accessioned 2010-07-14T09:59:44Z
dc.date.available 2010-07-14T09:59:44Z
dc.date.issued 2003-04-02
dc.identifier.citation International School of Photonics, Cochin University of Science and Technology en_US
dc.identifier.other J. Phys. D: Appl. Phys. 36 (2003) 990–993
dc.identifier.other PII: S0022-3727(03)58837-4
dc.identifier.uri http://dyuthi.cusat.ac.in/purl/1833
dc.description.abstract An open photoacoustic cell operating in the low range of chopping frequency has been employed to evaluate the thermal diffusivity values of intrinsic InP and InP doped with S, Sn and Fe. The experimental set-up is calibrated by the evaluation of thermal diffusivity value of pure Si and GaAs. The present investigation shows that doped samples show a reduced value for thermal diffusivity compared to intrinsic sample. From the analysis of data it is also seen that nature of dopant clearly influences the thermal diffusivity value of semiconductors. The results are explained in terms of phonon assisted heat transfer mechanism in semiconductors en_US
dc.language.iso en en_US
dc.publisher Journal of Physics D : Applied Physics, Institute of Physics Publishing en_US
dc.subject Thermal characterization en_US
dc.subject intrinsic and extrinsic InP en_US
dc.subject photoacoustics en_US
dc.subject thermal diffusivity en_US
dc.title Thermal characterization of intrinsic and extrinsic InP using photoacoustic technique en_US
dc.type Working Paper en_US


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